System for automating test the service life of the probe
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Release time:2016-04-09
Affilication of Author(s):School of Mechanical and Electronical Engineering
School Sign:Central South University
Patent Applicant:李军辉
Disigner of the Invention:李军辉
Patent description:本发明结构简单,测试数据精确,能实现探针使用寿命的自动评估
Type of Patent:Invent
State of Patent:Authorized patents
Application Number:2012102373106
Authorization number:CN102768348B
Number of Inventors:6
Service Invention or Not:no
Application Date:2012-07-10
Publication Date:2014-07-02
First Author:李军辉
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Postal Address:26fa0a7a357708a6ec919e0748a88f6e4f13188e6d545998342a94799485d8501bc0f14add0608cc491624b63e5bdbebc510ce6eb3d9e9385b833cf6c4bdbf8483c242ba30e02153b23dcf2808243a2e12b66faf90f51049e903b6a465f8bafdf168cfb9b807e479ab7abc0aacdaf5802f5fae54f92b773f377462fbba076833
Mobile:bb64de6b083d2d96029f0747d5e14f9067a726f05a810f6d1f79748474eb523f0973023af42edddf972d51580492ab77cf503f657a25b6c1a5400c5ba3b2e884e0cbc0139b985cc1791a315cd43019b51f1411006a3370b76bdaa6a7415840395c7aea7c6a2181920584b0bec4e30369e705202d12cdc4fa4c04fad3e5002c34
Email:00c2eff53d5748e084379825d9797c9b72df22d8b7698c0448e363d4f3a5c490e2bc28b1ea695164e77f14101312c365fc6419069d8d5f523dfaee9bbcdeaef97c190550918447b19004e90846f24e4b2c96f227bd9fff73033217d8ff0653191585b74731e00a09c758e2962f6dd55b41a4633f08a8d2fe50f1277bfe87efb2
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