中文

System for automating test the service life of the probe

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  • Release time:2016-04-09

  • Affilication of Author(s):School of Mechanical and Electronical Engineering

  • School Sign:Central South University

  • Patent Applicant:李军辉

  • Disigner of the Invention:李军辉

  • Patent description:本发明结构简单,测试数据精确,能实现探针使用寿命的自动评估

  • Type of Patent:Invent

  • State of Patent:Authorized patents

  • Application Number:2012102373106

  • Authorization number:CN102768348B

  • Number of Inventors:6

  • Service Invention or Not:no

  • Application Date:2012-07-10

  • Publication Date:2014-07-02

  • First Author:李军辉


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