中南大学
Visits:
HomeAn anti-degradation chaotic map and its statistical robustness analysis
Release time:2026-07-07
Hits:
- Journal:
- IEEE Transactions on Industrial Electronics
- Co-author:
- Wang H, Liu W
- First Author:
- Liu J
- Correspondence Author:
- Sun K
- Volume:
- 72
- Issue:
- 12
- Page Number:
- 14533-14542
- Translation or Not:
- no
- Date of Publication:
- 2025-07-25