A Fast and Robust Diagnostic Method for Multiple Open-circuit Faults of Voltage-Source Inverters through Line Voltage Magnitudes Analysis
发布时间：2020-11-25
点击次数：
影响因子：6.373
DOI码：10.1109/TPEL.2019.2941480
发表刊物：IEEE TRANSACTIONS ON POWER ELECTRONICS
合写作者：Chun-yang Chen, Shu Cheng, Te-fang Chen, Zhi-hong Mao, Kaidi Li
第一作者：Xun Wu
论文类型：期刊论文
通讯作者：Tian-jian Yu
学科门类：电气工程
文献类型：J
卷号：35
期号：5
页面范围：5205-5220
ISSN号：0885-8993
是否译文：否
发表时间：2020-05-01
收录刊物：SCI
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