中文

Reliability of charge carrier recombination datadetermined with charge extraction methods

Hits:

  • Release time:2019-11-26

  • Journal:J. Appl. Phys.

  • Co-author:D Neher, L. JKoster, VCorre, Y.Zou, J Yuan, ...F Gao, A Paulke, J Kniepert

  • Issue:126

  • Page Number:205501

  • Translation or Not:no

  • Date of Publication:2019-11-25


Central South University  All rights reserved  湘ICP备05005659号-1 Click:
  MOBILE Version

The Last Update Time:..