中南大学 Haoran Gong

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H. R. Gong*, Y. H. He and B. Y. Huang. Bond strength and interface energy between Pd membranes and TiAl supports. Applied Physics Letters, 2008, 93: 101907

Translation or Not:no

Links to published journals:http://lab.shily.me/publications/2008/APL93-101907.pdf

Pre One:H.R. Gong and K. J. Cho. First principles study of Nb-W bilayer metal gate electrode. Microelectronic Engineering 2009, 86: 240-243 Next One:H. R. Gong*, Y. Liu, H.P. Tang and C. S. Xiang. Bond strength and electronic structures of coherent Ir/Ir3Zr interfaces. Applied Physics Letters, 2008, 92: 211914