Impact Factor:10.856

Journal:IEEE Transactions on Image Processing

Key Words:Deep metric learning, deep feature embedding, image retrieval, graph neural network

First Author:Shichao Kan, Yigang Cen, Yang Li, Mladenovic Vladimir, Zhihai He

Indexed by:Journal paper

Volume:31

Page Number:2988-3003

Translation or Not:no

Included Journals:SCI

Pre One:Coded Residual Transform for Generalizable Deep Metric Learning Next One:A GAN-based input-size flexibility model for single image dehazing