Impact Factor:23.6

Journal:IEEE Transactions on Pattern Analysis and Machine Intelligence

Key Words:Contrastive Bayesian Analysis, Deep Metric Learning.

Note:CCF-A类

First Author:Shichao Kan, Zhiquan He, Yigang Cen, Yang Li, Vladimir Mladenovic, Zhihai He

Indexed by:Journal paper

Discipline:Engineering

First-Level Discipline:Computer Science and Technology

Document Type:J

Volume:45

Issue:6

Page Number:7220-7238

Translation or Not:no

Included Journals:SCI

Pre One:Singularformer: Learning to Decompose Self-Attention to Linearize the Complexity of Transformer Next One:Coded Residual Transform for Generalizable Deep Metric Learning