Relationship between densification behavior and stabilization of quasi-liquid grain boundary layers in CuO-doped 0.7CaTiO3-0.3NdAlO3 microwave ceramics

Pre One:Influence of A-Site Nonstoichiometry on Structure and Electrical Properties of K0.5Na0.5NbO3 Based Lead free Piezoelectric Ceramics

Next One:Sintering Behavior and Microwave Properties of Dense 0.7CaTiO3-0.3NdAlO3 Ceramics with Sub-micron Sized Grains by Spark Plasma Sintering