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基于光学磁驱相差检测的磁性纳米颗粒粒径分析系统

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  • Release time:2024-04-28

  • Disigner of the Invention:田博, 李婷婷, 张笑琰

  • Type of Patent:Invent

  • State of Patent:Authorized patents

  • Authorization number:ZL202210870012.4

  • Service Invention or Not:yes

  • Application Date:2022-07-22

  • Publication Date:2022-10-25

  • Authorization Date:2024-04-23

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