Language : English
Biyan Chen

Patents

一种数值积分参数化电离层层析方法

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Type of Patent:Invent

State of Patent:Authorized patents

Authorization number:ZL201910448560.6

Number of Inventors:1

Service Invention or Not:no

Authorization Date:2020-08-25

First Author:陈必焰

Authorization Date:2020-08-25