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一种晶体内部体缺陷的检测方法

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  • Release time:2025-03-28

  • School Sign:中南大学

  • Disigner of the Invention:Yuxia Duan, 陈小钰, 赵纪祥, 孟建桥

  • Type of Patent:Invent

  • State of Patent:Authorized patents

  • Authorization number:ZL202411720455.0

  • Number of Inventors:4

  • Service Invention or Not:no

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