H. R. Gong*, Y. H. He and B. Y. Huang. Bond strength and interface energy between Pd membranes and TiAl supports. Applied Physics Letters, 2008, 93: 101907
发布时间:2016-04-16
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发布期刊链接:http://lab.shily.me/publications/2008/APL93-101907.pdf
上一条: H.R. Gong and K. J. Cho. First principles study of Nb-W bilayer metal gate electrode. Microelectronic Engineering 2009, 86: 240-243
下一条: H. R. Gong*, Y. Liu, H.P. Tang and C. S. Xiang. Bond strength and electronic structures of coherent Ir/Ir3Zr interfaces. Applied Physics Letters, 2008, 92: 211914
