中文

Optimized subsequent-annealing-free Ni/Ag based metallization contact to p-type GaN for vertical light emitting diodes with high yield and extremely low operating voltage (2.75 V@350 mA,>95%)

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  • Release time:2018-02-07

  • Journal:J. Phys. D Appl. Phys. 47 (2014)115102

  • Co-author:G. Wang, J. Li, Z. Liu, X. Yi*, J. Guo, T. Zhan, Liancheng Wang*, T. Tian

  • Document Type:J

  • Translation or Not:no


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