Calculation of all-time apparent restistivity of large loop transient electromagnetic method with very fast simulated ammealing
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Release time:2020-08-09 Impact Factor:1.249 DOI number:10.1007/s11771-011-0827-y Affiliation of Author(s):School of Geosciences and Info-Physics, Central South University, Changsha 410083, China Teaching and Research Group:Applied Geophysics Journal:Journal of Central South University (English Edition) Place of Publication:China Key Words:very fast simulated annealing (VFSA); large loop transient electromagnetic method; rectangular loop; all-time apparent resistivity Abstract:In large loop transient electromagnetic method (TEM), the late time apparent resistivity formula cannot truly reflect the geoelectric model, thus it needs to define the all-time apparent resistivity with the position information of measuring point. Utilizing very fast simulated annealing (VFSA) to fit the theoretical electromagnetic force (EMF) and measured EMF could obtain the all-time apparent resistivity of the measuring points in rectangular transmitting loop. The selective cope of initial model of VFSA could be confirmed by taking the late time apparent resistivity of transient electromagnetic method as the prior information. For verifying the correctness, the all-time apparent resistivities of the geoelectric models were calculated by VFSA and dichotomy, respectively. The results indicate that the relative differences of apparent resistivities calculated by these two methods are within 3%. The change of measuring point position has little influence on the tracing pattern of all-time apparent resistivity. The first branch of the curve of all-time apparent resistivity is close to the resistivity of the first layer medium and the last branch is close to the resistivity of the last layer medium, which proves the correctness of the arithmetics proposed. Co-author:朱自强, 肖建平, 彭凌星 First Author:李建慧 Indexed by:Applied Research Correspondence Author:冯德山 Document Code:DOI：10.1007/s11771-011-0827-y Discipline:地质资源与地质工程 Document Type:J Volume:18 Issue:4 Page Number:1235-1240 ISSN No.:2095-2899 Translation or Not:no CN No.:43-1516/TB Date of Publication:2011-08-15 Included Journals:EI、SCI -
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