Reliability of charge carrier recombination datadetermined with charge extraction methods
发布时间:2019-11-26
点击次数:
发表刊物:J. Appl. Phys.
合写作者:D Neher, L. JKoster, VCorre, Y.Zou, J Yuan, ...F Gao, A Paulke, J Kniepert
期号:126
页面范围:205501
是否译文:否
发表时间:2019-11-25