Activation characterization of the Ti-Zr-V getter films deposited by magnetron sputtering

Release time:2021-07-12

Impact Factor:6.707

DOI number:10.1016/j.apsusc.2020.147059

Journal:Applied Surface Science

Abstract:Non-evaporable getter (NEG) thin films provide distributed pumping properties, allowing to achieve ultrahigh vacuum in narrow and conductance limited chambers. It is an ideal solution to deal with the small aperture of vacuum chambers. In this paper, ternary Ti-Zr-V getter film with approximate equal atomic ratio was deposited on oxygen free copper (OFC) substrate by using a developed DC magnetron sputtering system with an alloy target. Microstructural characterization by scanning electron microscopy, atomic force microscopy and energy dispersive spectroscopy (EDX) indicates that the porous getter film exhibit a columnar growth pattern and the grain sizes are very distributed ranging from several up to hundreds of nanometres. The compositions and the corresponding chemical bonding states are analyzed by using in-situ synchrotron radiation X-ray photoelectron spectroscopy after activation for 1 h at different temperatures in ultra-high vacuum. The results indicate that Ti, Zr and V are initially in their high oxidized states, which are gradually reduced in steps to oxides of lower valence states and finally to their metallic states. The reduction of vanadium oxides is more preferable than that of titanium- and zirconium-oxides. Such activation commences at a temperature as low as 150 degrees C, and can be enhanced by increasing temperature.

Co-author:Zhiwei Wang, Xin Shu, Yonghao Gao, Yong Wang

First Author:Sihui Wang

Indexed by:Journal paper

Correspondence Author:Wei Wei

Document Code:WOS:000576740300008

Discipline:Engineering

First-Level Discipline:Materials Science and Engineering

Document Type:J

Volume:528

Page Number:147059

ISSN No.:0169-4332

Translation or Not:no

Date of Publication:2020-10-30

Included Journals:SCI