一种基于横波背散射的六方晶材料近表面微小缺陷检测方法
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Release time:2021-09-26 Type of Patent:Invent State of Patent:Authorized patents Authorization number:ZL201810747244.4 Service Invention or Not:no Authorization Date:2020-09-29 First Author:李雄兵 黄远添 宋永锋 倪培君 -
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